From: Zenghui Yu yuzenghui@huawei.com
virt inclusion category: bugfix bugzilla: https://gitee.com/openeuler/kernel/issues/I8TN8N CVE: NA
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Currently fp_asimd_exit_stat is accumulated for *both* FP/ASIMD and SVE traps so that user can not distinguish between these two via debugfs.
Fix the manipulation for both exception classes.
Signed-off-by: Zenghui Yu yuzenghui@huawei.com Reviewed-by: Keqian Zhu zhukeqian1@huawei.com Signed-off-by: Zheng Zengkai zhengzengkai@huawei.com
Signed-off-by: lishusen lishusen2@huawei.com --- arch/arm64/kvm/hyp/include/hyp/switch.h | 1 + 1 file changed, 1 insertion(+)
diff --git a/arch/arm64/kvm/hyp/include/hyp/switch.h b/arch/arm64/kvm/hyp/include/hyp/switch.h index c91e641346d6..61907949e00f 100644 --- a/arch/arm64/kvm/hyp/include/hyp/switch.h +++ b/arch/arm64/kvm/hyp/include/hyp/switch.h @@ -297,6 +297,7 @@ static bool kvm_hyp_handle_fpsimd(struct kvm_vcpu *vcpu, u64 *exit_code) vcpu->stat.fp_asimd_exit_stat++; break; case ESR_ELx_EC_SVE: + vcpu->stat.sve_exit_stat++; if (!sve_guest) return false; break;